欢迎登录材料期刊网

材料期刊网

高级检索

为了确保基于NCV门库的量子电路的正确性和有效性,给出了量子电路故障定位树的生成算法和量子电路黑盒检测算法来定位量子电路中的门丢失故障.该故障定位树算法去除约98%的无用输出向量,提取输出表中有效的输入向量以及对应的故障输出向量,逐层生成故障定位树.结合量子电路黑盒检测算法对量子电路进行故障定位时不需要访问输出表就能够有效定位量子电路中的丢失门.对benchmarks部分电路进行实验,结果验证了该算法定位单故障门的有效性.

参考文献

[1] Rice J E.An overview of fault models and testing approaches for reversible logic[A].,2013:125-130.
[2] Patel K N;Hayes J P;Markov I L.Fault testing for reversible circuits[J].IEEE Transactions on Computer-Aided Design,200423(8):1220-1230.
[3] Sen B;Das J;Sikdar B K.A DFT methodology targeting online testing of reversible circuit[A].,2012:689-693.
[4] Wille R;Zhang H;Drechsler R.Fault ordering for automatic test pattern generation of reversible circuits[A].,2013:29-34.
[5] Kole D K;Rahaman H.Derivation of optimal test set for detection of multiple missing-gate faults in reversible circuits[A].,2010
[6] Zhang H;Wille R;Drechsler R.Improved fault diagnosis for reversible circuits[A].,2011:207-212.
[7] 齐学梅;陈付龙;罗永龙.高效容错可逆的汉明码编码和检测电路[J].量子电子学报,2013(5):586-593.
[8] Barenco A;Bennett C H;Cleve R.Elementary gates for quantum computation[J].Am Phys Soc,199552(5):3457-3467.
[9] Wille R;Lye A;Drechsler R.Considering nearest neighbor constraints of quantum circuits at the reversible circuit level[J].Quantum Information Processing,201313(2):185-199.
[10] Zhong J;Muzio J C.Analyzing fault models for reversible logic circuits[A].,2006:2422-2427.
[11] Maslov D .Reversible logic synthesis benchmarks page[OL].http://webhome.cs.uvic.ca/dmaslov/
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%