利用亚毫米尺度对称金属包覆波导,提出了一种大量程折射率仪的工作原理,这种仪器可测量气体、液体和固体的折射率.原理上,只要待测介质对所用激光波长透明,折射率测量范围不受限制.通过对空气、纯水和LiNbO3晶体的测量,结果表明仪器的测量精度小于3.0×10-3.
参考文献
| [1] | Lin S,Gong Z X.General Physics Experiments[M].Beijing:People's Education Press,1981:369-372. |
| [2] | Azzam R M A,Bashara N M.Ellipsometry and Polarized Light[M].Amsterdam,1977:269-416. |
| [3] | Chen I Y,Lynch D W.Scaming ellipsonmetry by rotating polarizer and analyzer[J].Appl.Opt.,1987,26:5221-5228. |
| [4] | Chen W P,Chen J M.Use of surface plasma waves for determination of the thickness and optical constants of thin metallic films[J].J.Opt.Soc.Am.,1981,71:186-191. |
| [5] | Otto A.Excitation of nonradiative surface plasma waves in sliver by the method of frustrated total reflection[J].Zeitschrift Für Physik A Hadrons and Nuclei,1996,216:398-410. |
| [6] | Li H G,Cao Z Q,Lu H F,et al.Free-space coupling of a light beam into a symmetrica metal-cladding optical waveguide[J].Appl.Phys.Lett.,2003,83:2757-2759. |
| [7] | Lu H F,Cao Z Q,Li H G,et al.Study of ultrahigh-order modes in a symmetrical metal-cladding opitical waveguide[J].Appl.Phys.Lett.,2004,85:4579-4581. |
| [8] | Ulrich R,Torge R.Measurement of thin film parameters with a prism copeler[J].Appl.Opt.,1973,12:2901-2908. |
| [9] | Yariv A.Quantum Electronics[M].2nd ed.,New York:Wiley and Sons,1975. |
| [10] | Lopez-Rios T,Vuye G.In situ investigation of metallic surface by surface plasmon ATR spectroscopy,electrical resistance mensurements and Auger spectroscopy[J].Journal of Physics E:Scientific Instruments,1982,15(4):456-461. |
| [11] | Lu Danyong,Liu Changjing,Zhou Huijun,et al.Using Mach-Zehnder interferometer to quantitatively measure the refractive index of air and its theoretical discussion[J].Physics Experimentation (物理实验) 2006,26(12):40-43(in Chinese). |
| [12] | Li Jingzhen.Handbook of Optics[M].Xi'an:Shaanxi Science and Technology Press,1986. |
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