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采用先进的丝网印刷设备和精密印刷技术,对MEMS器件玻璃浆料气密封装技术,包括丝网印刷、预烧结和键合工艺等进行了深入研究.采用三种不同线宽的丝网板对二次印刷工艺进行了优化,提高了玻璃浆料的平整度和均匀性.经烧结键合后的封装体具有较高的封接强度(剪切力>12kg)及良好的气密性(氦气精检合格率100%),可实现高质量的圆片级气密封装.

参考文献

[1] Harrie A. C. Tilmans;Myriam D. J. Van de Peer;Eric Beyne .The indent reflow sealing (IRS) technique--A method for the fabrication of sealed cavities for MEMS devices[J].Journal of Microelectromechanical Systems: A Joint IEEE and ASME Publication on Microstructures, Microactuators, Microsensors, and Microsystems,2000(2):206-217.
[2] Chien-Yu Chen;Cheng-Hui Hung;Jhih-You Jhong;Feng-Yah Wang,Wei-Min Hsaio,Meng-Jen Wang,Wei-Chung Wang .Demonstration of wafer capping through glass frit bonding and its application on molded platform package[J].Microsystems Packaging Assembly and Circuits Technology,2007,12:177-180.
[3] Charles Yang;Antai Xu;Ye Wang .Wafer Level Hermetic Packaging of MOEMS Devices[J].Electronic Manufacturing Technology Symposium,2007,8:294-297.
[4] Roy Knechtel .Glass frit bonding-an universal technology for wafer level encapsulation and packaging[J].Microsystem Technologies,2005,12(1-2):63-68.
[5] 许薇,王玉传,罗乐.玻璃浆料低温气密封装MEMS器件研究[J].功能材料与器件学报,2005(03):343-346.
[6] 孙以材,沈今楷,姬荣琴,常志红.压力传感器芯片键合用低温玻璃焊料的研制[J].电子器件,2000(01):36-42.
[7] M.Wiemer;J.Fr(o)mei;C.Jia;T.Gessner.Bonding and contacting of MEMS-structures on wafer level[A].Paris:International Symposium on Semiconductor Wafer Bonding 7th,2003:58-60.
[8] MIL-STD-833E,method 2019.5[M].
[9] MIL-STD-833E,method 1014.9[M].
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