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由于没有合适的衬底材料与之匹配,使外延生长的 GaN材料缺陷密度很大,从而限制了它的 应用。采用 LEO(横向过生长外延 )技术能使缺陷密度降低 3~ 4个数量级,可生长出高质量的 GaN 材料。本文简要介绍了应用 LEO技术生长 GaN材料的现状及对生长机理研究的进展。

Traditional epitaxial growth of GaN by MOCVD on mismatched substrates such as sapphire will produce high density of dislocations. Lateral growth of GaN films have a low density of disloca- tions. The mechanism of lateral epitaxy GaN was investigated in the work. It shows that the lateral growth rate is dependent strongly on the direction of the mask layer, TMG flow rates and temperature.

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