以铟、锡氯化物为前驱物,采用溶胶-凝胶法在玻璃基体上制备不同锡掺杂的ITO膜,在热处理温度为450 ℃条件下制备不同锡掺杂(质量分数11 %~33 %)的ITO膜,研究锡掺杂对ITO膜方阻和结构特性的影响.用四探针法测量ITO膜的方阻并对样品进行X射线衍射分析,结果表明:锡掺杂量在20 %时ITO膜的方阻最小,不同锡掺杂的ITO膜均为立方铁锰矿结构,锡掺杂会影响ITO膜晶粒尺寸、晶格常数和晶面取向等结构特性,ITO膜的晶粒较大、晶格畸变小、择优取向小时薄膜方阻较小.
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