以二甲基二硫(DMDS)和正硅酸乙酯(TEOS)为反应物,采用常压化学气相沉积法在HP40合金基体上成功制备了SiO2/S复合涂层.采用扫描电子显微镜(SEM)及其附带能谱仪(EDAX)、原子力显微镜(AFM)、X射线衍射(XRD)、Raman光谱等技术对涂层的形貌、元素成分、结构进行了表征,并对反应机理做了初步探讨.结果表明,SiO2/S复合涂层为无定形结构,主要由Si-O四面体的变形结构组成,S以S4及+4价状态与Si-O四面体的变形结构结合,涂层完整、致密.
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