工作气压在ITO薄膜的制备过程中是一个重要的工艺参数,直接决定着薄膜的性能.本文利用射频磁控溅射方法,采用氧化铟锡陶瓷靶材,在衬底温度为175℃,工作气压范围为0.45~1.0 Pa条件下,制备了氧化铟锡透明导电薄膜.研究了工作气压对其微观结构、表面形貌和光电特性的影响.在衬底温度为175℃、纯氩气中制备的氧化铟锡薄膜电阻率为3.04 ×10-4 Ω·cm、可见光波段(400~800 nm)透过率为91.9%,适合用作异质结太阳电池的前电极和减反射膜.
参考文献
[1] | Pla J;Tamasi M;Rizzoli R;Losurdo M Centurioni E Summonte C Rubinelli F .Optimization of ITO Layers for Applications in a-Si/c-Si Heterojunction Solar cell[J].Thin Solid Films,2003,425:185-192. |
[2] | Zhao L;Zhou ZB;Peng H;Cui RQ .Indium tin oxide thin films by bias magnetron rf sputtering for heterojunction solar cells application[J].Applied Surface Science: A Journal Devoted to the Properties of Interfaces in Relation to the Synthesis and Behaviour of Materials,2005(2):385-392. |
[3] | Uthanna S.;Naidu BS.;Reddy PJ.;Reddy PS. .PHYSICAL INVESTIGATIONS OF DC MAGNETRON SPUTTERED INDIUM TIN OXIDE FILMS[J].Vacuum: Technology Applications & Ion Physics: The International Journal & Abstracting Service for Vacuum Science & Technology,1996(1):91-93. |
[4] | Meng LH.;Placido F. .Annealing effect on ITO thin films prepared by microwave-enhanced dc reactive magnetron sputtering for telecommunication applications[J].Surface & Coatings Technology,2003(1):44-50. |
[5] | Jin Baek Choi;Jong Hoon Kim;Kyung Ah Jeon .Properties of ITO films on glass fabricated by pulsed laser deposition[J].Materials Science & Engineering, B. Solid-State Materials for Advanced Technology,2003(1/3):376-379. |
[6] | Prathap P;Subbaiah Y P V;Devika M et al.Investigations on the Structural Properties of Sprayed In2O3 Films[J].PVSEC,2000,2:1021-1022. |
[7] | Zhang J;Au K H;Zhu Z Q et al.Sol-gel Preparation of Poly (ehtylene glycol) Doped Indium Tin Oxide Thin Films for Sensing Applications[J].Optical Materials,2004,26:47. |
[8] | D. W. Kim;Y. J. Sung;J. W. Park;G. Y. Yeom .A study of transparent indium tin oxide (ITO) contact to p-GaN[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,2001(0):87-92. |
[9] | M. Quaas;C. Eggs;H. Wulff .Structural studies of ITO thin films with the Rietveld method[J].Thin Solid Films: An International Journal on the Science and Technology of Thin and Thick Films,1998(1/2):277-281. |
[10] | 付恩刚,庄大明,张弓,杨伟方,赵明.工作气压对磁控溅射ZAO薄膜性能的影响[J].功能材料,2003(05):543-545. |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%