本文应用吸收光谱法,对提拉法生长的Nd,Cr:GSGG晶体在不同气氛下退火后的光谱变化进行了研究.氧化气氛下退火后的吸收光谱中,在1μm处出现了由于晶体中存在Cr4+离子所引起的两个吸收带,被称为1μm吸收损失.还原气氛(CO和H2)下退火后的吸收光谱中,在1μm处的吸收带基本消失,这对于提高激光效率是非常有利的.此外,在642nm处的吸收带强度有一定的减弱.这些数据对于晶体后处理工艺的改进和激光器设计具有重要的参考价值.
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