在GaAs的(110)、(001)和(111)A、(111)B等极性晶面上, 通过铜铟共溅-硒蒸镀的方法, 分布外延生长出(220/204)、(001)和(112)结晶取向的单晶CIS薄膜. 系统考察了CIS薄膜外延生长的结晶取向和表面微结构, 发现了这些CIS外延薄膜均需表面重构化而形成比表面能低的CIS(112)晶面, 结合晶体结构研究了各种晶面和比表面能的相关性. 通过各种衬底下不同结晶取向的CIS薄膜的太阳能电池组装, 发现当CIS薄膜生长具有(220/204)结晶取向时电池器件性能最好、效率最高, 说明可通过控制CIS薄膜的沉积条件和选用合适取向的衬底, 增加吸收层(220/204)的结晶取向, 从而显著提高CIS薄膜太阳电池的光电性能.
The mechanism of preferential orientation and surfacereconstruction of CIS thin films was systematically investigated. Epitaxial CISthin films with orientations of (220/204), (001) and (112) were deposited onGaAs(110), (001), (111)A and (111)B substrates, respectively, by using ametal-sputtering and Se-evaporation hybrid technique. The main epitaxialrelationship was found to be GaAs(110) // CIS(220), GaAs(001) // CIS(001), and GaAs(111) // CIS(112), respectively. The morphological and structuralproperties of CIS thin films were determined by scanning electron microscope,atomic force microscope and X-ray diffraction. The (220/204) and (001) surfacesof CIS thin films were found to be unstable under the growth conditions. The depositedsurfaces were mainly covered by the lowest specific surface-energy (112) facetregardless of its orientation. Sequence of the specific surface-energy for CISfacets was deduced, based on the geometrical analysis of the defects. Solarcells with preferential oriented CIS thin films as absorber layers werefabricated. The (220/204)-oriented film is characterized to have the best photovoltaicperformance, which is consistent with the charge transportation and separationpreferring along [220] direction. It indicates that higher efficiency of CIS thinfilm solar cells can be expected by enhancing (220/204) orientation through processoptimization.
参考文献
[1] | Repins I, Contreras M A, Egaas B, et al. 19.9%-efficient ZnO/CdS/ CuInGaSe2 solar cell with 81.2% fill factor. Prog. Photovoltaics, 2008, 16(3): 235-239.[2] Contreras M A, Romero M J, Noufi R. Characterization of Cu(InGa)Se2 materials used in record performance solar cells. Thin Solid Films, 2006, 511: 51-54.[3] Contreras M A, Jones K M, Gedvilas L, et al. Preferred Orientation in Polycrystalline Cu(In,Ga)Se2 and Its Effect on Absorber Thin-films and Devices. 16th European Photovoltaic Solar Energy Conference and Exhibition, Glasgow, Scotland, 2000.[4] Hanna G, Mattheis J, Laptev V, et al. Influence of the selenium flux on the growth of Cu(In,Ga)Se2 thin films. Thin Solid Films, 2003, 431: 31-36.[5] Kim K H, Yoon K H, Yun J H, et al. Effects of Se flux on the microstructure of Cu(In,Ga)Se2 thin film deposited by a three-stage co-evaporation process. Electrochemical and Solid State Letters. 2006, 9(8): A382-A385.[6] Tiwari A N, Blunier S, Kessler K, et al. Direct growth of heteroepitaxial CuInSe2 layers on Si substrates. Appl. Phys. Lett., 1994, 65(18): 2299-2301.[7] Calvet W, Lehmann C, Plake T, et al. Epitaxial CuInSe2 on Si(111) using ditertbutyl disulfide as sulphur precursor. Thin Solid Films, 2005, 480: 347-351.[8] Igarashi O. Epitaxial-growth of CuInSe2 single-crystal by halogen transport method. J. Cryst. Growth. 1993, 130(3): 343-356.[9] Jaffe J E, Zunger A. Defect-induced nonpolar-to-polar transition at the surface of chalcopyrite semiconductors. Phys. Rev. B, 2001, 64(24): 241304-1-3.[10] Salinger J. Measurement of solar cell parameters with dark forward I-V characteristics. Acta Polytechnica, 2006, 46(4): 25-27. |
- 下载量()
- 访问量()
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%