采用低温水溶液法, 在涂覆ZnO种子层的ITO基底上制备了高度取向的ZnO棒晶阵列, 考察了棒晶的生长过程以及生长液浓度、生长时间对薄膜形貌的影响. 用扫描电子显微镜(SEM),X射线衍射(XRD), 场发射扫描显微镜(FESEM)以及高分辨透射电镜(HRTEM)对ZnO纳米棒的结构和形貌进行了表征. 结果表明, ZnO薄膜的形貌强烈依赖于生长溶液的浓度和生长时间, ZnO棒是单晶, 属于六方纤锌矿结构, 具有沿(002)晶面择优生长的特征, 生长方式为层层台阶生长, 反应时间达到48h后, 通过二次生长形成特殊的板状晶.
Highly c-oriented ZnO films were prepared on ZnO buffer-coated ITO substrate by a solution method at 80℃. The effects of precursor concentration and growth time on the morphology of the films were investigated. The structure, morphology were characterized by using X-ray diffraction, transmission electron microscope, scanning electron microscope, field emission scanning electron
microscope. The results show that the morphology of ZnO films is strongly dependent on the precursor concentration and growth time, all the ZnO rods belong to the hexagonal wurtzite structure . The growth manner of ZnO is layer by layer. Special lath-like crystals formed by secondary growth when growth time was 48h.
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