对目前国内外电子和光子封装用无铅钎料研究和应用的新进展和发展趋势进行了回顾、评述和展望,重点评述了无铅钎料的种类和钎焊接头的力学性能、封装结构的可靠性和耐久性,以及目前出现的影响电子封装可靠性的一些新问题(如电迁移和锡须问题).对光子封装钎料和相关钎焊工艺也进行了简要评述.最后,探讨了电子和光子封装无铅钎料及其可靠性和耐久性研究的发展趋势.
参考文献
[1] | J.F.Patrick,L.Fevre,Environmental issues in power electronics(Lead Bee),in:Applied Power Electronics Conferenee and Exposition(Texas,USA,10-14 March 2002) p.1,121-125 |
[2] | Y.Fukuda,M.G.Pecht,K.Fukuda,S.Fukuda,Lead-free soldering in the Japanese Electronics Industry,IEEE Transaction on Components and Packaging Technologies,3(26),616(2003) |
[3] | B.Trumble,Get the lead out!,IEEE Spectrum,5,55(1998) |
[4] | ZHANG Xinping.WANG Hongwei,HUA Zigui,The composition optimization of solders based on the studies of surface-active behavmr of microadding elements,Journal of Xi'an Jiaotong University,2s(4),14(1994)(张新平,王红卫,华自圭,基于微量添加元素表面活性研究的钎料成分优化,西安交通大学学报,28(4),14(1994)) |
[5] | X.P,Zhang,H.W.Wang,Y.W.Shi,Influence of elements Bi.Ag and In on surface tension and processing perfor mance of tin-lead based solders,J.Mater.Sci-Mater.EL,15,511(2004) |
[6] | U.R.Kattner,W.J.Boettinger,On the Sn-Bi-Ag ternary phase diagram,J.Elec.Mater.,23,603(1994) |
[7] | X.P.Zhang,C.B.Yu,S.Shrestha,L.Dorn,Creep and fatigue behaviors of the lead-free Sn-Ag-Cu-Bi and Sn60Pb40 solder interconnectious at elevated tempera tures.J.Mater.Sci-Mater.EL.,18,665(2007) |
[8] | A.Grusd,Integrity of solder joints from lead-free solder paste,in:National Electronic Packaging and Production Conference Proceedings of the Technical Program(West and East),1,212-221(1999) |
[9] | Y.Fukuda.P.Casey,M.Pecht,Evaluation of selected Japanese lead-free consumer electronics,Trans.Elec.Pack.Manufac.,26(4),305(2003) |
[10] | Zs.Illyefalvi-Vitéz,J.Pinkola,G.Harsányi,Cs.Dominkovics,B.Illés,L.Tersztyánszky,Present status of transition to Pb-free soldering,Electronics Technology:Meeting the Challenges of Electronics Technology Progress,28th International Spring Seminar,19-20 May 2005,88-93 |
[11] | J.H.L.Pang,B.S.Xiong,T.H.Low,Creep and fatigue characterization of lead free 95.5Sn-3.8Ag-0,7Cu solder,in:Proceedings of 54th ECTC,Vol.2,(Las Vegas,USA,1-4 June 2004)p.1333 |
[12] | A.H.Yanagawa,E.Ide,K.F.Kobayashi,Joint strength and interfacial microstructure between Sn-Ag-Cu and Sn-Zn-Bi solders and Cu substrate,Sci.Tech.Adv.Mater.,5,267(2004) |
[13] | LI Bo.SHI Yaowu,XIA Zhidong,LEI Yongping,GUO Fu,Research on the SnAgCu lead free solder with minute amount rare earth elements,Electronics Process Technol-ogy,25(5),193(2004)(李擘,史耀武,夏志东,雷水平,郭福,添加微量稀土元素的 SnAgCu无铅钎料的研究,电子工艺技术,25(5),193(2004)) |
[14] | D.Suraski.K.Seelig,The current status of lead-free sol-der alloys,IEEE Trans.Elec.Pack.Manufac.,24(4),244(2001) |
[15] | S.Wiese,K.J.Wolter,Micrcetructure and creep behaviour of eutectic SnAg and SnAgCu solders,Microelectronics Reliability,44(12),1923(2004) |
[16] | ZHANG Xinpin,YU Chuangbao,ZHANG Yupeng,ZHU min,Creep-resistance performance of two lead-free solders and comparison with Sn60Pb40 solder.Transactions of the China Welding Institution,28(2),1(2007)(张新平,于传宝,张宇鹏,朱敏,两种无铅钎料的抗蠕变性能及与Sn60Pb40钎料的比较,焊接学报,28(2),1(2007)) |
[17] | X.P.Zhang,L.M.Yin,C.B.Yu,Thermal creep and fracture behaviors of the lead-free Sn-Ag-Cu-Bi solder interconnections under different stress levels,J.Mater.Sci-Mater.EL.,2007(in press,online on 30 June 2007) |
[18] | C.M.L.Wu,A promising lead-free material for flipchip bumps:Sn-Cu-RE,4th Ihternational Conference on Advanced Semiconductor Devices and Microsystems.(Smolenice Castle,Slovakia,14-16 October 2002)p.17-26 |
[19] | Q.Yu,T.Kiga,M.Takeuchi,K.Toi,Y.Katou,CSP mounting reliability with Sn-Zn-Bi in JIEP project,Proceedings of 2nd International Symposium on Environmentally Conscious Design and Inverse Manufacturing,(Tokyo,Japan,11-15 December 2001)p.1059-1063 |
[20] | J.M.Song,G.F.Lan,T.S.Lui,L.H.Chen,Microstructure and tensile properties of Sn-9Zn-xAg lead-free solder alloys,Scripta Materialia,48,1047(2003) |
[21] | WU Wenyun,QIU Xiaoming,YIN Shiqiang,SUN Daqian,LI Minggao,Influence of Bi,Ag on microstructure and properties of Sn-Zn lead-free solder,The Chinese Journal of Nonferrous Metals,16(1),158(2006)(吴文云,邱小明,殷世强,孙大谦,李明高,Bi、Ag 对 Sn-Zn无铅钎料性能与组织的影响,中国有色金属学报,16(1),158(2006)) |
[22] | YU Daquan,ZHAO Jie,WANG Lai,Wetting properties of Sn-9Zn solder alloy with trace rare earth elements,The Chinese Journal of Nonferrous Metals,13(4),1001(2003)(于大全,赵杰,王来,稀土元素对Sn-9Zn合金润湿性能的影响,中国有色金属学报,13(4),1001(2003)) |
[23] | ZHANG Wendian,Applied Surlace Mount Technology,(Bejjing,Publishing House of Electronics Industry,2006)p.197(张文典,实用表面组装技术(北京,电子工业出版社,2006)p.197) |
[24] | R.K.Shiue,L.W.Tsay,C.L.Lin,J.L.Ou,A study of Sn-Bi.Ag-(In)lead-free solders,J.Mater.Sci.,38,1269(2003) |
[25] | J.H.Lau,C.P.Wong,N.C.Le,S.W.R.Lee.Electronits Manufacturing with Lead-free,Halogen-free &Conductive-Adhensive Materials(Beijing,Chemical Industry Press,2005)(J.H.Lau,C.P.Wong,N.C.Le,S.W.R.Lee,电子制造技术-利用无铅.无卤素和导电胶材料,姜岩峰,张常年译(北京,化学工业出版社,2005)) |
[26] | N.C.Lee,Flux technology for lead-free alloys and its impact on cleaning,27th Annual IEEE/CPMT/SEMI International Electronics Manufacturing Technology Sympceium,San Jose,CA USA,17-18 July,2002,IEMT 2002,316-322 |
[27] | WANG Suli,LEI Yongping,XIA Zhiadong,SHI Yaowu,LI Xiaoyan,Development of no-clean flux for lead-free solder,Electronics Process Technology,25(4),147(2004)(王素丽,雷永平,夏志东,史耀武,李晓延,无铅钎料用免清洗助焊剂的研制,电子工艺技术,25(4),147(2004)) |
[28] | K.N.Tu,J.C.M.Li.Spontaneous whisker growth on leadfree solder finishes,Mater.Sci.Eng.,A409,131(2005) |
[29] | Y.Fukuda,M.Osterman,M.Pecht,The impact of electrical current,mechanical bending,and thermal annealing on tin whisker growth.Microelectronics Reliability,47,88(2007) |
[30] | J.Brusse.Tin whisker observations on pure tin-plated ceramic chip capacitors,AESF SUR/FIN Proceedings,(Navy Pier,Chicago,USA,24-27 June,2002)p.45-61 |
[31] | I.K.Huit,B.Ralph,A study of the initiation of the tombstoning effect on leadless chips,Int.J.Mach.Tool.Manufac.,35,1251(1995) |
[32] | K.Zeng,R.Stierman,T.C.Chiu,D.Edwards,K.Ano,K.N.Tu.Kirkendall void formation in eutectic SnPb solder joint on bare Cu and its effect on joint reliability,J.Appl.Phys.,97,024508(2005) |
[33] | T.R.Homa,Cracking of electronic packaging joints due to creep-fatigue,in:Proceedings of ASM's 3rd Conference on Electronic Packaging and Corrosion in Microelectronics,(Minneapolis,Minnesota,28-30 April 1987) P.209-216 |
[34] | K.Zeng,K.N.,Tu,Six cases of reliability study of Pb-free solder joints in electronic packing technology,Mater.Sci.Eng.,R38,55(2002) |
[35] | C.Chen,S.W.Liang,Electromigration issues in lead-free solder joints,J.Mater.Sci-Mater.EL.,18,259(2007) |
[36] | K.N.Tu,K.Zeng,Tin-lead(SnPb) solder reaction in flip chip technology,Mater.Sci.Eng.,R34,1(2001) |
[37] | M.Li,F.Zhang,W.T.Chen,K.Zeng,K.N.,Tu,H.Balkan,P.Elenius,Interfacial microstructure evolution between eutectic SnAgCu solder and Al/Ni(V)/Cu thin films,J.Mater.Resear.,17,1612(2001) |
[38] | H.T.Chen,C.Q.Wang,M.Y.Li,D.W.Tian,Effect of Cu diffusion through Ni on the interfacial reactions of Sn3.5Ag0.75Cu and SnPb solders with Au/Ni/Cu substrate during aging,Mater.Lett.,60,1669(2006) |
[39] | H.T.Chen,C.Q.Wang,M.Y.Li,Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling,Microelectronics Reliability,46,1348(2006) |
[40] | B.Ebersberger,R.Bauer,L.Alexa,Reliability of lead free SnAg solder bumps:Influence of electromigration and temperature,Proceedings of 2005 IEEE/ECTC,2005,1407-1415 |
[41] | K.J.Puttlitz,G.T.Galyon,Impact of the ROHS Directive on high-performance electronic systems Part Ⅱ:Key reliability issues preventing the implementation of lead-free solders,J.Mater.Sci-Mater.EL.,18347(2007) |
[42] | R.K.Kirschman,W.M.Sokolowski,E.A.Kolawa.Die attachment for-120 ℃ to+20℃ thermal cycling of microelectronics for future mars rovers-An overview,J.Electronic Packaging,123,105(2001) |
[43] | A.C.Keenoy,D.M.Lee,J.S.Lehtonen,A.S.Francomacaro.Indium bump bonding for cryogenic applications,Proceedings of SPIE,4587,106(2001) |
[44] | E.Suhir,The future of microelectronics and photonics and the role of mechanics and materials,J.Electronic Packaging,120,1(1998) |
[45] | R.R.Tummala,Fundamentals of Microsystems Packaging (McGraw-Hill,New York,2001) |
[46] | H.Hentzell,M.0lson,G.Arvidsson,0ptical packaging technology-the next innovations.in:14th European Microelectronics and Packaging Conference & Exhibition (Friedrichshafen,Germany,23-25 June 2003) p.1-5 |
[47] | C.C.Lee,S.Choe,Fluxless In-Sn bonding process at 140 ℃,Mater.Sci.Eng.,A333(1-2),45(2002) |
上一张
下一张
上一张
下一张
计量
- 下载量()
- 访问量()
文章评分
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%