应用电化学阻抗谱(EIS)技术以单槽和串联双槽两种方式测量了同一环氧涂层金属样品5个测试点在浸泡过程中阻抗行为的变化.通过两种测试方式中涂层金属体系各测量点的极化电阻Rp(Rp=Rc+Rct+Rdiff)间的关联性,说明了涂层金属的EIS双槽检测技术的可靠性.实验结果表明:同一样品两个测试点的阻抗差别较大时,采用串联双槽测量的总阻抗值与其中的高阻抗测试点的阻抗值更为接近,两个测试点单槽测量的Rp(Rc+Rct+Rdiff)之和(∑Rpi)与双槽测量的Rp间存在较大偏差;阻抗相近的两个测试点进行串联测量时,Rp近似等于两点分别以单槽方法所得Rp之和(∑Rpi);两个测试点的阻抗均较小时,串联后测得的Rp与两点单独测量的Rp之和间存在较大偏差.
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