欢迎登录材料期刊网

材料期刊网

高级检索

参考文献

[1] O. Ambacher;B. Foutz;J. Smart.Two dimensional electron gases induced by spontaneous and piezoelectric polarization in undoped and doped AlGaN/GaN heterostructures[J].Journal of Applied Physics,20001(1):334-344.
[2] Tan Xin;Lü Yuanjie;Gu Guodong;Wang Li;Dun Shaobo;Song Xubo;Guo Hongyu.High performance AlGaN/GaN HEMTs with AlN/SiNx passivation[J].半导体学报(英文版),2015(7):94-97.
[3] Wang Zheli;Zhou Jianjun;Kong Yuechan;Kong Cen;Dong Xun;Yang Yang;Chen Tangsheng.Thin-barrier enhancement-mode AlGaN/GaN MIS-HEMT using ALD Al2O3 as gate insulator[J].半导体学报(英文版),2015(9):62-65.
[4] Su, L.-Y.;Lee, F.;Huang, J.J..Enhancement-Mode GaN-Based High-Electron Mobility Transistors on the Si Substrate With a P-Type GaN Cap Layer[J].IEEE Transactions on Electron Devices,20142(2):460-465.
[5] Hwang, I.;Kim, J.;Choi, H. S.;Choi, H.;Lee, J.;Kim, K. Y.;Park, J.-B.;Lee, J. C.;Ha, J.;Oh, J.;Shin, J.;Chung, U..p-GaN Gate HEMTs With Tungsten Gate Metal for High Threshold Voltage and Low Gate Current[J].IEEE Electron Device Letters,20132(2):202-204.
[6] Deguchi, T.;Kikuchi, T.;Arai, M.;Yamasaki, K.;Egawa, T..High On/Off Current Ratio p-InGaN/AlGaN/GaN HEMTs[J].IEEE Electron Device Letters,20129(9):1249-1251.
[7] Lanford W.B.;Tanaka T.;Otoki Y.;Adesida I..Recessed-gate enhancement-mode GaN HEMT with high threshold voltage[J].Electronics Letters,20057(7):449-450.
[8] Lee, Y.-C.;Kao, T.-T.;Merola, J.J.;Shen, S.-C..A Remote-Oxygen-Plasma Surface Treatment Technique for III-Nitride Heterojunction Field-Effect Transistors[J].IEEE Transactions on Electron Devices,20142(2):493-497.
[9] T. Fujii;N. Tsuyukuchi;Y. Hirose;M. Iwaya;S. Kamiyama;H. Amano;I. Akasaki.Fabrication of enhancement-mode Al_xGa_1-xN/GaN junction heterostructure field-effect transistors with p-type GaN gate contact[J].Physica Status Solidi. C, Conferences and critical reviews,20077(7):2708-2711.
[10] Uemoto Y.;Hikita M.;Ueno H.;Matsuo H.;Ishida H.;Yanagihara M.;Ueda T.;Tanaka T.;Ueda D..Gate Injection Transistor (GIT)—A Normally-Off AlGaN/GaN Power Transistor Using Conductivity Modulation[J].IEEE Transactions on Electron Devices,200712(12):3393-3399.
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%