欢迎登录材料期刊网

材料期刊网

高级检索

参考文献

[1] Wang Jianhui,Wang Xinhua,Pang Lei,et al.Effect of varying layouts on the gate temperature for multi-finger AlGaN/GaN HEMTs.Journal of Semiconductors,2012,33(9):094004
[2] Shen L,Heikman S,Moran B,et al.AlGaN/AlN/GaN highpower microwave HEMT.IEEE Electron Device Lett,2001,22(10):457
[3] Long Fei,Du Jiangfeng,Luo Qian,et al.A research on current collapse ofGaN HEMTs under DC high voltage.Chinese Journal of Semiconductors,2006,27(z1):227
[4] Liu Guoguo,Zheng Yingkui,Wei Ke,et al.An 8W X band AlGaN/GaN power HEMT.Journal of Semiconductors,2008,29(7):1354
[5] Shen L,Coffie R,Buttari D,et al.High-power polarizationengineered GaN/AlGaN/GaN HEMTs without surface passivation.IEEE Electron Device Lett,2004,25(1):7
[6] Suita M,Nanjo T,Oishi T,et al.Ion implantation doping for AlGaN/GaN HEMTs.Bremen,Germany:Wiley-VCH Verlag,2006
[7] Wang L,Kim D,Adesida I.Direct contact mechanism of ohmic metallization to AlGaN/GaN heterostructures via ohmic area recess etching.Appl Phys Lett,2009,95(17):172107
[8] Van Daele B,Van Tendeloo G,Derluyn J,et al.Mechanism for ohmic contact formation on Si3N4 passivated AlGaN/GaN high-electron-mobility transistors.Appl Phys Lett,2006,89(20):190820
[9] Bardwell J A,Haffouz S,Tang H,et al.Electrical characterization and surface morphology of optimized Ti/Al/Ti/Au ohmic contacts for AlGaN/GaN HEMTs.J Electrochem Soc,2006,153(8):G746
[10] Miller M A,Mohney S E.V/Al/V/Ag ohmic contacts to nAlGaN/GaN heterostructures with a thin GaN cap.Appl Phys Lett,2007,91:121031
[11] Gong R,Wang J,Dong Z,et al.Analysis on the new mechanisms of low resistance stacked Ti/Al ohmic contact structure on AlGaN/GaN HEMTs.J Phys D:Appl Phys,2010,43(39):395102
[12] Smorchkova I P,Chen L,Mates T,et al.AlN/GaN and (Al,Ga)N/AlN/GaN two-dimensional electron gas structures grown by plasma-assisted molecular-beam epitaxy.J Appl Phys,2001,90(10):5196
[13] Kaun S W,Wong M H,Mishra U K,et al.Correlation between threading dislocation density and sheet resistance of AlGaN/AlN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy.Appl Phys Lett,2012,100(26):210226
上一张 下一张
上一张 下一张
计量
  • 下载量()
  • 访问量()
文章评分
  • 您的评分:
  • 1
    0%
  • 2
    0%
  • 3
    0%
  • 4
    0%
  • 5
    0%