In order to connect several independent LEDs in series,inductively coupled plasma (ICP) deep etching of GaN is required for isolation.The GaN-based high-voltage (HV) LEDs with a 5 μm deep isolation groove and an acceptable mesa sidewall angle of 79.2° are fabricated and presented.The surface morphology and construction profile of the etched groove are characterized by laser microscopy and scanning electron microscopy.After contact metal formation and annealing,the electrical properties are evaluated by Ⅰ-Ⅴ characteristics.The trend of the Ⅰ-Ⅴ curve has good accordance with conventional LEDs.The contact resistance of HV LEDs is also tested and was reduced by 4.6 Ω compared to conventional LEDs,while the output power increased by 5 W.The results show that this technique can be applied to practical fabrication.
参考文献
[1] | Shul R J,McClellan G B,Casalnuovo S A,etal.Inductively coupled plasma etching of GaN.Appl Phys Lett,1996,69(8):1119 |
[2] | Song I J,Lee S K,Lee K,et al.Properties of etched Ga-and N-faces of freestanding GaN substrate using inductively coupled plasmareactive ion etching.Jpn J Appl Phys,2002,41(3B):L317 |
[3] | Kao C C,Kuo H C,Yeh K F,etal.Light-output enhancement of nano-roughened GaN laser lift-off light-emitting diodes formed by ICP dry etching IEEE Photonics Technol Lett,2007,19(11):849 |
[4] | Huang H W,Lin C H,Yu C C,et al.Investigation of GaNbased vertical-injection light-emitting diodes with GaN nanocone structure by ICP etching.Mater Sci & Eng B,2008.151(3):205 |
[5] | Han Y,Xue S,Guo W,et al.Characteristics of n-GaN after ICP etching.Proceedings of the SPIE,the International Society for Optical Engineering,2002,4918:193 |
[6] | Wang P.Cao B,Gan Z,et al.A study of GaN-based LED structure etching using induetively coupled plasma.Journal of Physics:Conference Series,2011,276(1):012082 |
[7] | Lin F,Shen B,Lu L,et al.Identification and elimination of inductively coupled plasma-induced defects in AlxGa1-xN/GaN heterostructures.Chin Phys B,2011,20(7):77303 |
[8] | Gao Wei,Guo Weiling,Zhu Yanxu,et al.Reliability of AlGalnP light emitting diodes with an ITO current spreading layer.Journal of Semiconductors,2009,30(6):064004 |
[9] | Meng Lili,Chen Yixin,Ma Li,et al.ICP dry etching ITO to improve the perfomance ofGaN-based LEDs.Journal of Semiconductors,2011,32(1):014010 |
[10] | Qiu Rongfu,Lu Hai,Chen Dunjun,et al.Optimization ofinductively coupled plasma deep etching of GaN and etching damage analysis.Appl Surf Sci,2011,257(7):2700 |
[11] | He Anhe,Zhang Yong,Zhu Xuehui,et al.Improved light extraction of GaN-based light-emitting diodes with surface-textured indium tin oxide electrodes by nickel nanoparticle mask dryetching.Chin Phys B,2010,19(6):068101 |
- 下载量()
- 访问量()
- 您的评分:
-
10%
-
20%
-
30%
-
40%
-
50%