研究冶金级硅低速定向凝固过程中杂质铁的再分布。采用ICP-MS检测铁的浓度，绘制铁在固相、液相、晶界和晶体生长方向上的浓度示意图。铁浓度在固、液相中具有明显差异。依据质量守恒定理，计算得出溶质边界层约为4 mm，铁的有效分凝系数约为2.98×10?4。在低速凝固条件下，铁容易偏析聚集在晶界。在生长方向上，由于低速凝固，铁浓度在硅锭86%高度以下几乎恒定，不完全符合Scheil方程规律。讨论了对流对铁再分布的影响，对流“死区”对铁再分布具有重要影响。
Redistribution of iron during directional solidification of metallurgical-grade silicon (MG-Si) was conducted at low growth rate. Concentrations of iron were examined by ICP-MS and figured in solid and liquid phases, at grain boundary and in growth direction. Concentrations are significantly different between solid and liquid phases. The thickness of the solute boundary layer is about 4 mm verified by mass balance law, and the effective distribution coefficient is 2.98×10?4. Iron element easily segregates at grain boundary at low growth rate. In growth direction, concentrations are almost constant until 86% ingot height, and they do not meet the Scheil equation completely, which is caused by the low growth rate. The effect of convection on the redistribution of iron was discussed in detail. Especially, the “dead zone” of convection plays an important role in the iron redistribution.
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