半导体学报(英文版), 2017, 38(5): 82-87.
10.1088/1674-4926/38/5/054008

A high performance 3 inch 0.5 μm InP DHBT technology with three interconnecting layers has been developed.The epitaxial layer structure and geometry parameters of the device were carefully studied to get the required performances.The 0.5 × 5μm2 InP DHBTs demonstrated ft =350 GHz,fmax =532 GHz and BVcEo =4.8 V,which were modeled using Agilent-HBT large signal model.As a benchmark circuit,a dynamic frequency divider operating from 110 to 220 GHz has been designed,fabricated and measured with this technology.The ultra-high-speed 0.5μm InP DHBT technology offers a combination of ultra-high-speed and high breakdown voltage,which makes it an ideal candidate for next generation 100 GHz+ mixed signal integrated circuits.
关键词:
引用: . 半导体学报(英文版), 2017, 38(5): 82-87. doi: 10.1088/1674-4926/38/5/054008
参考文献:

相似文献: